![](/img/cover-not-exists.png)
[IEEE 2007 IEEE International Symposium on Circuits and Systems - New Orleans, LA, USA (2007.05.27-2007.05.30)] 2007 IEEE International Symposium on Circuits and Systems - ADCs, Chaos and TRNGs: a Generalized View Exploiting Markov Chain Lumpability Properties
Callegari, Sergio, Setti, GianlucaYear:
2007
Language:
english
DOI:
10.1109/iscas.2007.378314
File:
PDF, 654 KB
english, 2007