In situ transmission electron microscopy-investigations on the strain-induced B19′-phase in NiTi shape memory alloys structured by focused ion beam
A. Kröger, R. Wernhardt, Ch. Somsen, G. Eggeler, A. WieckVolume:
438-440
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.msea.2006.04.119
File:
PDF, 967 KB
english, 2006