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Development of a Universal Platform for Hardware In-the-Loop Testing of Microgrids
Wang, Jing, Song, Yulun, Li, Wendong, Guo, Ji, Monti, AntonelloVolume:
10
Language:
english
Journal:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/TII.2014.2349271
Date:
November, 2014
File:
PDF, 2.02 MB
english, 2014