Voltage dependence of hard breakdown growth and the...

IEEE Electron Device Letters 2002 / 11 Vol. 23; Iss. 11

Voltage dependence of hard breakdown growth and the reliability implication in thin dielectrics

Linder, B.P., Lombardo, S., Stathis, J.H., Vayshenker, A., Frank, D.J.
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Volume:
23
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2002.805010
Date:
November, 2002
File:
PDF, 261 KB
english, 2002
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