![](/img/cover-not-exists.png)
[IEEE 2008 International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) - Lviv, Ukraine (2008.05.21-2008.05.24)] 2008 International Conference on Perspective Technologies and Methods in MEMS Design - Machine vision — automation of selected measurement systems
Kuzanski, Marcin, Fabijanska, Anna, Sankowski, Dominik, Jackowska-Strumillo, LidiaYear:
2008
Language:
english
DOI:
10.1109/memstech.2008.4558739
File:
PDF, 786 KB
english, 2008