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[IEEE 2008 IEEE Symposium on Visual Analytics Science and Technology (VAST) - Columbus, OH, USA (2008.10.19-2008.10.24)] 2008 IEEE Symposium on Visual Analytics Science and Technology - Configurable Spaces: Temporal analysis in diagrammatic contexts
Kapler, Thomas, Eccles, Ryan, Harper, Robert, Wright, WilliamYear:
2008
Language:
english
DOI:
10.1109/vast.2008.4677355
File:
PDF, 4.92 MB
english, 2008