[IEEE Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting - St. Louis, MO, USA (12-15 Oct. 1998)] Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting (Cat. No.98CH36242) - Computational estimation of ESD conditions between charged particles and grounded surfaces
Dascalescu, L., Ribardiere, P., Duvanaud, C., Allam, R.Volume:
3
Year:
1998
Language:
english
DOI:
10.1109/ias.1998.729805
File:
PDF, 460 KB
english, 1998