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[IEEE 2006 IEEE Workshop on Microelectronics and Electron Devices, 2006. WMED '06. - Boise, ID, USA (April 14, 2006)] 2006 IEEE Workshop on Microelectronics and Electron Devices, 2006. WMED '06. - Comparative study of tan-tin and tin gate stacks for thermally stable pfets
Ramaswamy, N., Mcteer, A., Ananthan, V., Palaniappan, N., Owens, T., Sanh Tang,, Iyer, R., Shixin Wang,, Mouli, C.Year:
2006
Language:
english
DOI:
10.1109/wmed.2006.1678306
File:
PDF, 990 KB
english, 2006