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[IEEE 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Bordeaux, France (2013.09.30-2013.10.3)] 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - Local extraction of base and thermal resistance of bipolar transistors
Setekera, Robert, van der Toorn, Ramses, Kloosterman, WillyYear:
2013
Language:
english
DOI:
10.1109/bctm.2013.6798135
File:
PDF, 383 KB
english, 2013