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[IEEE 2011 IEEE Custom Integrated Circuits Conference - CICC 2011 - San Jose, CA, USA (2011.09.19-2011.09.21)] 2011 IEEE Custom Integrated Circuits Conference (CICC) - Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS
Abu-Rahma, Mohamed H., Chen, Ying, Sy, Wing, Ong, Wee Ling, Ting, Leon Yeow, Yoon, Sei Seung, Han, Michael, Terzioglu, EsinYear:
2011
Language:
english
DOI:
10.1109/cicc.2011.6055315
File:
PDF, 263 KB
english, 2011