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[IEEE 2008 58th Electronic Components and Technology Conference (ECTC 2008) - Lake Buena Vista, FL, USA (2008.05.27-2008.05.30)] 2008 58th Electronic Components and Technology Conference - Assessment of PCB pad cratering resistance by joint level testing
Roggeman, Brian, Borgesen, Peter, Li, Jing, Godbole, Guarav, Tumne, Pushkraj, Srihari, K., Levo, Tim, Pitarresi, JamesYear:
2008
Language:
english
DOI:
10.1109/ECTC.2008.4550081
File:
PDF, 956 KB
english, 2008