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[IEEE 2010 IEEE Symposium on Visual Analytics Science and Technology (VAST) - Salt Lake City, UT, USA (2010.10.25-2010.10.26)] 2010 IEEE Symposium on Visual Analytics Science and Technology - Helping users recall their reasoning process
Lipford, Heather Richter, Stukes, Felesia, Dou, Wenwen, Hawkins, Matthew E., Chang, RemcoYear:
2010
Language:
english
DOI:
10.1109/VAST.2010.5653598
File:
PDF, 465 KB
english, 2010