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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Failure Analysis and Test Solutions for Low-Power SRAMs
Zordan, L.B., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Todri, A., Virazel, A., Badereddine, N.Year:
2011
Language:
english
DOI:
10.1109/ATS.2011.97
File:
PDF, 510 KB
english, 2011