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Reliability Analysis of UHF RFID Tags Under a Combination of Environmental Stresses
Saarinen, Kirsi, Frisk, LauraVolume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2012.2220966
Date:
March, 2013
File:
PDF, 463 KB
english, 2013