Quantitative atomic force microscopy analysis of slip...

Materials Science and Engineering: A 2008 Vol. 483-484; Iss. none

Quantitative atomic force microscopy analysis of slip traces in Ni3Al yield stress anomaly

Joël Bonneville, Christophe Coupeau
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Volume:
483-484
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.msea.2006.12.158
File:
PDF, 394 KB
english, 2008
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