[IEEE 2008 9th International Scientific-Technical Conference on Actual Problems of Electronic Instrument Engineering (APEIE) - Novosibirsk, Russia (2008.09.23-2008.09.25)] 2008 9th International Conference on Actual Problems of Electronic Instrument Engineering - Mathematical model of E-class device subject to loss in key
Vilmitsky, D.S., Devyatkov, G.N.Year:
2008
Language:
english
DOI:
10.1109/apeie.2008.4897150
File:
PDF, 205 KB
english, 2008