[IEEE 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, UK (10-13 July 1995)] Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Dielectric characterization of CVD diamond thin films
Hernandez-Velez, M., Sanchez-Garrido, O., Fernandez-Gutierrez, F., Sanchez-Olias, J., Albella-Martin, J.M.Year:
1995
Language:
english
DOI:
10.1109/ICSD.1995.523023
File:
PDF, 351 KB
english, 1995