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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Diagonal test and diagnostic schemes for flash memories
Sau-Kwo Chiu,, Jen-Chieh Yeh,, Chih-Tsun Huang,, Cheng-Wen Wu,Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041743
File:
PDF, 481 KB
english, 2002