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[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - Application of single-crystal CVD diamond and SiC detectors for diagnostics of ion emission from laser plasmas
Ryc, L., Calcagno, L., Dubecky, F., Margarone, D., Nowak, T., Parys, P., Pfeifer, M., Riesz, F., Torrisi, L.Year:
2012
Language:
english
DOI:
10.1109/asdam.2012.6418519
File:
PDF, 160 KB
english, 2012