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[IEEE 2012 IEEE Thirteenth International Vacuum Electronics Conference (IVEC) - Monterey, CA, USA (2012.04.24-2012.04.26)] IVEC 2012 - Advances in fabrication error analysis for a mm-wave ring-bar TWT circuit
Sengele, Sean, Barsanti, Marc, Hargreaves, Tom, Armstrong, Carter, Booske, John H., Lau, Yue YingYear:
2012
Language:
english
DOI:
10.1109/ivec.2012.6262268
File:
PDF, 220 KB
english, 2012