[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA...

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[IEEE 2008 Symposium on VLSI Technology - Honolulu, HI, USA (2008.06.17-2008.06.19)] 2008 Symposium on VLSI Technology - Novel 3-D structure for ultra high density flash memory with VRAT (Vertical-Recess-Array-Transistor) and PIPE (Planarized Integration on the same PlanE)

Jiyoung Kim,, Hong, Augustin J., Masaaki Ogawa,, Siguang Ma,, Song, Emil B., You-Sheng Lin,, Jeonghee Han,, U-In Chung,, Wang, Kang L.
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Year:
2008
Language:
english
DOI:
10.1109/vlsit.2008.4588587
File:
PDF, 2.14 MB
english, 2008
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