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An Optical Method for Strain-Controlled Fatigue Testing of Microspecimens
Kim, Chung-Youb, Sharpe, William N., Hemker, Kevin J.Volume:
21
Language:
english
Journal:
Journal of Microelectromechanical Systems
DOI:
10.1109/jmems.2012.2190976
Date:
August, 2012
File:
PDF, 306 KB
english, 2012