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[IEEE 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop (IMS3TW 2008) - Vancouver, BC, Canada (2008.06.18-2008.06.20)] 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop - An approach to model-based testing of mixed-signal SiPs
Muller, Reik, Wegener, Carsten, Jentschel, Hans-JoachimYear:
2008
Language:
english
DOI:
10.1109/IMS3TW.2008.4581604
File:
PDF, 850 KB
english, 2008