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[IEEE 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - Seoul, Korea (South) (2011.08.7-2011.08.10)] 2011 IEEE 54th International Midwest Symposium on Circuits and Systems (MWSCAS) - A new static test of a DAC with a built-in structure
Kim, Incheol, Jang, Jaewon, Son, Hyeonuk, Kang, SunghoYear:
2011
Language:
english
DOI:
10.1109/mwscas.2011.6026361
File:
PDF, 1.33 MB
english, 2011