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[IEEE 2013 IEEE XXXIII International Scientific Conference on Electronics and Nanotechnology (ELNANO 2013) - Kiev (2013.4.16-2013.4.19)] 2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO) - Geometrical measuring at 3D stereoscopic radiography

Miroshnychenko, S. I., Nevhasymyy, A. A., Volkov, E. V.
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Year:
2013
Language:
english
DOI:
10.1109/ELNANO.2013.6552082
File:
PDF, 348 KB
english, 2013
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