[IEEE 2013 International Conference on Simulation of...

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[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Simulation of terahertz plasmons in graphene with grating-gate structures

Satou, Akira, Ryzhii, Victor, Otsuji, Taiichi, Vasko, Fedir T., Mitin, Vladimir V.
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Year:
2013
Language:
english
DOI:
10.1109/sispad.2013.6650624
File:
PDF, 738 KB
english, 2013
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