[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Importance of Oxygen Vacancies in High K Gate Dielectrics
Robertson, John, Xiong, Ka, Tse, Koon-yiuYear:
2007
Language:
english
DOI:
10.1109/icicdt.2007.4299548
File:
PDF, 1.09 MB
english, 2007