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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - A 90 nm bulk CMOS radiation hardened by design cache memory
Yao, Xiaoyin, Clark, Lawrence T., Patterson, Dan W., Holbert, Keith E.Year:
2009
Language:
english
DOI:
10.1109/radecs.2009.5994698
File:
PDF, 949 KB
english, 2009