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[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - A comparison analysis of air, liquid, and two-phase cooling of data centers
Ohadi, M.M., Dessiatoun, S. V., Choo, K., Pecht, M., Lawler, John V.Year:
2012
Language:
english
DOI:
10.1109/stherm.2012.6188826
File:
PDF, 667 KB
english, 2012