[Institute of Electrical and Electronics Engineers 1985 IEEE International Solid-State Circuits Conference - New York, NY, USA (February 1985)] 1985 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 90ns 1Mb DRAM with multi-bit test mode
Kumanoya, M., Fujishima, K., Tsukamoto, K., Nishimura, Y., Saito, K., Matsukawa, T., Yoshihara, T., Nakano, T.Volume:
XXVIII
Year:
1985
Language:
english
DOI:
10.1109/isscc.1985.1156837
File:
PDF, 510 KB
english, 1985