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[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - A novel technique for concurrent on & amp; off - board emi analysis of mixed RF-digital circuits via hybrid scattering parameters
Bayram, Y., Volakis, J.L., Roblin, P.Volume:
3
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513651
File:
PDF, 485 KB
english, 2005