[IEEE 2011 18th IEEE International Symposium on the...

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[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Advanced scanning acoustic technique application in flip-chip devices

Hu, X.H., Tay, M. Y., Tan, M.C., Zhao, X.L., Chin, J.M., Lei, H.
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Year:
2011
Language:
english
DOI:
10.1109/IPFA.2011.5992791
File:
PDF, 1.68 MB
english, 2011
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