[IEEE 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Minneapolis, MN, USA (2013.05.6-2013.05.9)] 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - To develop an optical system model for image based multi-degree-of-freedom measurement system
Chen, Chun-Jen, Chang, Chun-Li, Hsiao, Wen-Tse, Hung, Min-Wei, Jywe, Wenyuh, Teng, YunfengYear:
2013
Language:
english
DOI:
10.1109/i2mtc.2013.6555481
File:
PDF, 268 KB
english, 2013