![](/img/cover-not-exists.png)
[IEEE Comput. Soc. Press Rensselaer's Second International Conference on Computer Integrated Manufacturing - Troy, NY, USA (21-23 May 1990)] [1990] Proceedings. Rensselaer's Second International Conference on Computer Integrated Manufacturing - Control of surface topographies formed during machining
Zhang, G.M., Hwang, T.W., Harhalakis, G.Year:
1990
Language:
english
DOI:
10.1109/CIM.1990.128122
File:
PDF, 697 KB
english, 1990