![](/img/cover-not-exists.png)
[IEEE 2008 International Workshop on Junction Technology (IWJT) - Shanghai, China (2008.05.15-2008.05.16)] Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08) - Improved formal passivations of pseudomorphic high electron mobility transistors
Li-Yang Chen,, Shiou-Ying Cheng,, Kuei-Yi Chu,, Jung-Hui Tsai,, Tzu-Pin Chen,, Tsung-Han Tsai,, Wen-Chau Liu,Year:
2008
Language:
english
DOI:
10.1109/iwjt.2008.4540046
File:
PDF, 299 KB
english, 2008