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[IEEE Sixth International Conference on Intelligent Systems Design and Applications - Jian, China (2006.10.16-2006.10.16)] Sixth International Conference on Intelligent Systems Design and Applications - Neural Network Approach for Multiple Fault Test of Digital Circuit

Zhongliang, Pan, Ling, Chen, Shouqiang, Liu, Guangzhao, Zhang
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Volume:
3
Year:
2006
Language:
english
DOI:
10.1109/isda.2006.32
File:
PDF, 147 KB
english, 2006
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