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TCAD Methodology for ESD Robustness Prediction of Smart Power ESD Devices
Salamero, C., Nolhier, N., Gendron, A., Bafleur, M., Besse, P., Zecri, M.Volume:
6
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2006.881483
Date:
September, 2006
File:
PDF, 701 KB
english, 2006