[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis
Keim, Martin, Tamarapalli, Nagesh, Tang, Huaxing, Sharma, Manish, Rajski, Janusz, Schuermyer, Chris, Benware, BradyYear:
2006
Language:
english
DOI:
10.1109/test.2006.297715
File:
PDF, 218 KB
english, 2006