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[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Fluctuations of the low frequency noise of MOS transistors and their modeling in analog and RF-circuits
Brederlow, R., Weber, W., Schmitt-Landsiedel, D., Thewes, R.Year:
1999
Language:
english
DOI:
10.1109/iedm.1999.823869
File:
PDF, 343 KB
english, 1999