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Low-frequency noise in thick-film resistors due to two-step tunneling process in insulator layer of elemental MIM cell
Jevtic, M.M., Stanimirovic, Z., Mrak, I.Volume:
22
Language:
english
Journal:
IEEE Transactions on Components and Packaging Technologies
DOI:
10.1109/6144.759361
Date:
March, 1999
File:
PDF, 260 KB
english, 1999