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[IEEE IEEE International Test Conference - (ITC) - Baltimore, MD, USA (17-21 Oct. 1993)] Proceedings of IEEE International Test Conference - (ITC) - MixTest: A mixed-signal extension to a digital test system

Mehtani, R., Atzema, B., De Jonghe, M., Morren, R., Seuren, G., Zwemstra, T.
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Year:
1993
Language:
english
DOI:
10.1109/test.1993.470605
File:
PDF, 720 KB
english, 1993
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