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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Investigation and Improvement of Fast Temperature-Cycle Reliability for DMOS-Related Conductor Path Design
Smorodin, Tobias, Wilde, Jurgen, Alpern, Peter, Stecher, MatthiasYear:
2007
Language:
english
DOI:
10.1109/relphy.2007.369939
File:
PDF, 6.29 MB
english, 2007