[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Mastering safety and reliability in a model based process
Cressent, Robin, Idasiak, Vincent, Kratz, Frederic, David, PierreYear:
2011
Language:
english
DOI:
10.1109/rams.2011.5754506
File:
PDF, 622 KB
english, 2011