Nondestructive inspection using Compton scatter tomography
Evans, B.L., Martin, J.B., Burggraf, L.W., Roggemann, M.C.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682682
Date:
June, 1998
File:
PDF, 805 KB
english, 1998