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Model to determine the backup capacity of a wafer foundry
Tu *, Ying-Mei, Chao, Yu-Hsiu, Chang, Sheng-Hung, You, Huan-ChungVolume:
43
Language:
english
Journal:
International Journal of Production Research
DOI:
10.1080/0020754042000264554
Date:
January, 2005
File:
PDF, 207 KB
english, 2005