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A Contactless Method for High-Sensitivity Measurement of p-n Junction Leakage
Verkuil, Roger L., Curtis, Huntington W., Pak, Mun S.Volume:
24
Language:
english
Journal:
IBM Journal of Research and Development
DOI:
10.1147/rd.243.0370
Date:
May, 1980
File:
PDF, 642 KB
english, 1980