[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Reliability indicators for lift-off of bond wires in IGBT power-modules
Farokhzad, B., Turkes, P., Wolfgang, E., Goser, K.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888233
File:
PDF, 297 KB
english, 1996