[IEEE 2012 IEEE International Ultrasonics Symposium - Dresden, Germany (2012.10.7-2012.10.10)] 2012 IEEE International Ultrasonics Symposium - Ultrasonic defect detection in multi-material, axis-symmetric devices with an improved synthetic aperture focusing technique (SAFT)
Scharrer, Thomas, Koch, Andreas, Fendt, Karl Thomas, Rupitsch, Stefan J., Sutor, Alexander, Ermert, Helmut, Lerch, ReinhardYear:
2012
Language:
english
DOI:
10.1109/ULTSYM.2012.0260
File:
PDF, 1.22 MB
english, 2012