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[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis
Vatajelu, Elena I., Panagopoulos, Georgios, Roy, Kaushik, Figueras, JoanYear:
2010
DOI:
10.1109/etsym.2010.5512778
File:
PDF, 564 KB
2010