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[IEEE 2008 IEEE International Conference on Semiconductor Electronics (ICSE) - Johor Bahru, Malaysia (2008.11.25-2008.11.27)] 2008 IEEE International Conference on Semiconductor Electronics - 12N test procedure for NPSF testing and diagnosis for SRAMs
Julie, R.R., Wan Zuha, W.H., Sidek, R.M.Year:
2008
Language:
english
DOI:
10.1109/SMELEC.2008.4770357
File:
PDF, 5.48 MB
english, 2008